Round-trip delay measurements Independent transmitter and receiver testing Senior through mode measurement
Description
OTM2540 43G OTN transport test module is one of OPWILL’s modular test products. OTM2540 can be configured on OTP6800 test platforms to achieve TN test functionalities and offer comprehensive test solutions for metro network. It is a high cost-effective network test product.
Highlights
Offer 43GSDH/SONET/OTN test functionsFEC capability analysis and ODU multiplex test of OTU3 optical signal as per ITU-T G.709Automatic signal structure discovery in smartmode, automatically detect and monitor error pathsIntuitionistic user interface, fast configuration of signal pathsCustomizable various forms of test reportApplications
OTN testing at the OTU3 level including FEC as per ITU-T G.709
Support OTU3 (43Gbit/s) optical interface relative testBERT and FEC analysis of OTU3 according to ITU-T G.709 frames2.5G/10G SDH/SONET signal synchronous/asynchronous mapping and demapping in OTNRound-trip delay measurementsIndependent transmitter and receiver testingOTN alarm generation and monitoringOTN overhead manipulation and captureFrequency analysis and power measurementFrequency offset generationAutomatic protection switching and service disruption time measurementsSenior through mode measurementOTM2540 OTN Series Specifications | |||
Test Interfaces | |||
OTU3(43G) optical interface | |||
BNC DS1/E1/2MHz outside clock interface | |||
Test Features | |||
OTN | |||
Payloads | Support mapping/demapping from AU-3/AU-4/AU-4-4c/AU-4-16c to OTU1 Support mapping/demapping from AU-3/AU-4/AU-4-4c/AU-4-16c/AU-4-64c to OTU2 Support multiplexing/demultiplexing from ODU0,ODU1,ODU2,ODUflex to ODU3 | ||
Test patterns | PBBS | 2E23,2E31 | |
Fixed | All 1s,All 0s | ||
User programmable | Allowing user define 8-byte test pattern | ||
Error injection | FAS,BIP-8(SM, PM, TCM1-6),BEI(SM, PM, TCM1-6), Bit,FECcorrectable bit, FECcorrectable code word, FECuncorrectable code word,Fec correctable Symbol | ||
Alarm generation | OTU:LOF,OOF ,LOM, OOM,AIS,SM-BDI,SM-IAE,SM-TIM,SM-BIAE ODU:ODTU-LOFLOM,ODU-AIS,ODU-OCI,ODU-LCK,ODU-BDI,ODU-TIM,ODU-FSF,ODU-BSF,ODU-FSD,ODU-BSD ODU-TCM1~6:BDI,IAE,TIM,LTC,BIAE OPU:OPU-PLM,OPU-CSF,OPU-MSIM,CLIENT-LSS | ||
Test result | Error | FAS,BIP-8(SM, PM, TCM1-6),BEI(SM, PM, TCM1-6), Bit,FECcorrectable bit, FECcorrectable code word, FECuncorrectable code word | |
Alarm | OTU:LOF,OOF,LOM, OOM ,AIS,SM-BDI,SM-IAE,SM-TIM,SM-BIAE ODU:AIS,ODU-OCI,ODU-LCK TCM1~6:BDI,IAE,TIM,LTC,BIAE PM:BDI,TIM | ||
Overhead features | Manipulation and capture
| Overhead setting: all bytes are editable, not including MFAS, SM BIP, PM BIP, TCM1-6 BIP Continuous and variable capture ability Display integrated overhead | |
Protection switching time | Term of service disruption | Alarm: LOS, LOM, OOM, SM-IAE, SM-BIAE, ODU-AIS, ODU-OCI, ODU-LCK, PM-BDI; Error: MFAS, PM-BIP, PM-BEI, payload errors | |
Delay | Time test precision 0.1ms | ||
Other Test and Measurement Functions | |||
Power measurement | Support power measurement of optical interface(dBm). Precision:0.1dBm. Range:-40~+8.2dBm | ||
Frequency measurement | Support clock frequency measurement of optical interface(measure received frequency of input signal and deviation with rating frequency), display in b/s(bps) and ppm. PrecisionL 1b/s and 1 ppm | ||
Frequency offset generation | Support to offset signal transmission clock in selected interface, and recover the circuit through tested network clock. Generation range:-100ppm~+100ppm | ||
Loop-back delay measurement | Measure the time of one overhead sending from OTM2540 TX and loop-back then back to RX. Suitable for all interfaces and mapping. MeasurementL final RTD time, minimum calue, maximum value, average value, measured count(successful TRD measurement number), loss measurement count. | ||
Through mode | Support OTU3 high level through mode | ||
Path scan | Automatically scan pointed signal structure path | ||
OTM2540 43G OTN Transport Test Module
